Do-Hui Kima, Jeong-Eun Limb, Byeong-Jun Parkb, Sam-Haeng Yib,c, Myung-Gyu Leeb,c, Joo-Seok Parkc and Sung-Gap Leea,b,*
aMajor in Ceramic Engineering, School of Materials Science and Engineering, Gyeongsang National University, Jinju 52828, Korea
bDepartment of Materials Engineering and Convergence Technology, Research Institute for Green Convergence Technology, Gyeongsang National University, Jinju 52828, Korea
cBusiness Support Division, Korea Institute of Ceramic Engineering and Technology, Jinju 52851, Korea
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La0.7Sr0.3-xBixMnO3 (LSBMO) (0.025 ≤ x ≤ 0.15) films are fabricated by a sol-gel method and spin-coating method. All of the fabricated films have typical polycrystalline perovskite structures. In addition, no preferential orientation or impurity could be observed. The surface SEM images show almost homogeneous and uniform microstructures and the average thickness for the LSBMO films is approximately 230 to 260 nm. When the resistivity is measured at room temperature, the TCR and B85/25-values gradually increases as the amount of Bi3+ increased, and the highest values of 0.023 mΩ·cm, 0.31%/°C and 299 K are obtained in the La0.7Sr0.225Bi0.075MnO3 thin films. Polycrystalline LSBMO films follow the variable-range hopping (VRH) conduction model as they show electron-electron scattering and electron-phonon interactions for thermal stimulation
Keywords: La0.7Sr0.3-xBixMnO3 films, Sol-gel method, Structural properties, Electrical properties, Thermistor
2023; 24(4): 650-654
Published on Aug 31, 2023
aMajor in Ceramic Engineering, School of Materials Science and Engineering, Gyeongsang National University, Jinju 52828, Korea
bDepartment of Materials Engineering and Convergence Technology, Research Institute for Green Convergence Technology, Gyeongsang National University, Jinju 52828, Korea
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