15 mol% nickel-doped titanium oxide thin films were prepared from metal naphthenate precursors. Films prefired at 500 degrees C for 10 minutes were annealed at 600 degrees C for 30 minutes in air. The crystallinities of the annealed films were investigated by a high resolution X-ray diffraction system. A surface morphological study was made to characterize the surface structure of the films. A sharp absorption edge of the films was observed. The films containing nickel showed a shift towards the visible in the absorption threshold.
Keywords: Nickel, TiO2 film, crystallinity, absorption edge