In research on YBa2Cu3O7 coated conductors, the development of buffer layers for epitaxial growth of YBa2Cu3O7 is very important. In our work, epitaxial buffer layers of Y2O3 have been deposited on biaxially textured Ni and NiW substrates using a continuous electron beam evaporation technique. The surface morphology and texture of Y2O3 buffer layers were characterized using SEM and XRD. The results show a sharp (200) orientation distribution and a smooth surface. Textured, crack-free, continuous Y2O3 buffer layers were obtained on moving tape using electron beam evaporation.

Keywords: coated conductor; buffer layer; e-beam evaporation; Y2O3