Woon-Yong Parka, Yoon-Tae Parka, Byung Guk Ahna,b,* and Ki-Tae Leea,b,c,d,*
aDivision of Advanced Materials Engineering, Jeonbuk National University, Jeonbuk 54896, Republic of Korea
bHydrogen and Fuel Cell Research Center, Jeonbuk National University, Jeonbuk 54896, Republic of Korea
cDepartment of Energy Storage/Conversion Engineering of Graduate School (BK21 FOUR), Jeonbuk National University, Jeonbuk 54896, Republic of Korea
dDepartment of JBNU-KIST Industry-Academia Convergence Research, Jeonbuk National University, Jeonbuk 54896, Republic of Korea
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Photo-electrochromic devices (PECDs) can be spontaneously colored by sunlight and used as energy storage devices. The major obstacle to improving the performance of PECDs is the self-discharge at the interface between electrolyte and electrochromic layers. To prevent self-discharge, we deposited ultra-thin Al2O3 films on the WO3 electrochromic layer using atomic layer deposition (ALD). The ALD-deposited Al2O3 layer effectively suppressed the self-discharge phenomenon that results from the reduction of iodine. Therefore, the transmittance modulation (ΔT), photocharged voltage, and discharge capacity increased with an increasing number of ALD cycles. Specifically, the discharge capacity of the PECD-A5 sample fabricated with five ALD cycles increased by 63.7% compared to the PECD without an Al2O3 layer. However, the relatively thick Al2O3 layer of the PECD-A10 sample fabricated with ten ALD cycles resulted in performance degradation due to the slow Li+ ion diffusion rate.
Keywords: Photo-electrochromic device, Electrochromic property, Self-discharge, Discharge capacity, Atomic layer deposition.
2024; 25(1): 34-40
Published on Feb 29, 2024
aDivision of Advanced Materials Engineering, Jeonbuk National University, Jeonbuk 54896, Republic of Korea
bHydrogen and Fuel Cell Research Center, Jeonbuk National University, Jeonbuk 54896, Republic of Korea
cDepartment of Energy Storage/Conversion Engineering of Graduate School (BK21 FOUR), Jeonbuk National University, Jeonbuk 54896, Republic of Korea
dDepartment of JBNU-KIST Industry-Academia Convergence Research, Jeonbuk National University, Jeonbuk 54896, Republic of Korea
Byung Guk Ahn : Tel : +82-63-270-2300 Fax: +82-63-270-2386
Ki-Tae Lee : Tel : +82-63-270-2290 Fax: +82-63-270-2386