Advancement of semiconductor technology, introduction of 5G networks, and expansion of the electric vehicle market have gradually increased the demand for highly reliable multilayer ceramic capacitors (MLCCs) owing to requirement of miniature electronic equipment. Efforts to achieve high reliability are underway to improve the properties of materials such as dielectrics, internal electrodes, and external electrodes. However, there are few studies on appropriate measurement methods for evaluating reliability, deterioration mechanisms, and lifetime calculations. In this study, an MLCC device was made to deteriorate through the highly accelerated life test (HALT), and the capacitance–voltage (C–V), temperature coefficient of capacitance (TCC), and current–voltage (I–V) characteristics were analyzed according to the elapsed time of deterioration. In addition, the activation energy (Ea) and voltage acceleration coefficient (n) were extracted through a lifetime prediction experiment, and the results of failure in time (FIT) and mean time to failure (MTTF) indicated the lifetime of the MLCC. From the results, it was confirmed that the insulation resistance evaluated using the HALT is an important factor for confirming the reliability and lifetime characteristics of MLCCs

Keywords: Multilayer ceramic capacitor, Highly accelerated life test, Failure in time, Mean time to failure