Articles
  • Quenching effect of the exciton emission induced by an electric field in needle-like CdS rods

  • Hyeoncheol Kima, T.S. Jeonga,* and T. S. Kimb

  • aSemiconductor Physics Research Center (SPRC), School of Semiconductor and Chemical Engineering, Jeonbuk National University, Jeonju 54896, Korea
    bDepartment of Physics, Jeonbuk National University, Jeonju 54896, Korea

  • This article is an open access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/4.0) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

In this paper, we studied the influence of electric fields on the exciton emissions of the needle-shaped CdS rod by using the combined photocurrent/photoluminescence (PC/PL) spectroscopies. We observed that the exciton emission strongly depended on the electric field while the defect-related emission weakly depended on the electric field. Intensity quenching and peak-shift effects of the exciton spectrum were observed as the electric field increased. To explain these effects, combined PC/PL measurements were introduced and they showed that excitons readily interact with the PC carriers of the photocreated electrons and holes. This interaction reduced the number of carriers participating in recombination, and the cause of the intensity decrease was attributed to the reduced recombination of free excitons. Thus, the shift of the exciton peaks was related to Stark effect induced by electric field. Consequently, we extracted out that exciton–electron scattering in emission spectra were the result of an interaction induced by the external electric field


Keywords: Electric field, Exciton-electron scattering, Stark effect

This Article

  • 2022; 23(2): 132-136

    Published on Apr 30, 2022

  • 10.36410/jcpr.2022.23.2.132
  • Received on Apr 29, 2021
  • Revised on Sep 24, 2021
  • Accepted on Sep 25, 2021

Correspondence to

  • T.S. Jeong

  • Semiconductor Physics Research Center (SPRC), School of Semiconductor and Chemical Engineering, Jeonbuk National University, Jeonju 54896, Korea
    Tel : +82 63 270 3326 Fax: +82 63 270 3585

  • E-mail: tsj@chonbuk.ac.kr