Minho Kima,
Uiho Choia, Kyeongjae
Leea, Donghyeop Junga, Taemyung Kwaka, Byeongchan Soa, KapRyeol Kub
and Okhyun Nama,*
aNano-Optical Engineering, Korea Polytechnic
University (KPU), Siheung, Gyeonggi 427-793, Republic of Korea
bSKC Advanced Technology R&D Center, #12, Jeongja-ro,
Jangan-hu, Suwon-Si, Gyeonggi-do, Republic of Korea
We investigated the effects of
NH3 pretreatment time on N-polar GaN grown on 4o off-cut
C-face 4H-SiC using high temperature metal-organic chemical vapor deposition.
The NH3 pre-treatment time was changed from 2 to 32 minutes at
1,350 oC. The polarity of layer was confirmed by aqueous KOH
etching method. As the NH3 treatment time increased, the etch rate
of the layer was increased and the structural and optical properties were
deteriorated. The total hillock density of samples was 7.5, 12.9, and 25.1 × 102
cm-2 respectively. Furthermore, we compared the luminescence spectra
of Ga-polar and N-polar GaN films using low-temperature photo-luminescence
measurement. The N-polar GaN layer showed Y1 peak (3.45 eV), which is
attributed to the existence of inversion domain boundary (IDB) in the layer.
Keywords: Epitaxy; Metalorganic chemical vapor deposition; Gallium nitride; Nitrogen polar; Pre-treatment
2020; 21(5): 579-585
Published on Oct 31, 2020
Nano-Optical Engineering, Korea Polytechnic University (KPU), Siheung, Gyeonggi 427-793, Republic of Korea
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