Nanocrystalline zinc oxide thin films were prepared on silica glass and soda-lime-silica substrates from a zinc naphthenate precursor. Films pyrolyzed at 500oC for 10 minutes were annealed for 30 minutes in air at 600 oC. A field emission scanning electron microscope and an atomic force microscope were used for characterizing the surface morphology and the surface roughness of the ZnO film. A sharp absorption edge of the ZnO film on the silica glass substrate was observed, while it was difficult to obtain an exact result from the ZnO on soda-lime-silica glass.
Keywords: ZnO film, zinc naphthenate, absorption edge