Articles
  • Dielectric properties and microstructures of (CaxSr1-x) ZrO3 ceramics
  • Yu-De Li, Jian-Ming Chen and Ying-Chieh Lee*
  • Department of Materials Engineering National Pingtung University of Technology and Science, Taiwan, R.O.C
Abstract
The effects of Ca/Sr ratio and the sintering temperature on the properties of (CaxSr(1-x))ZrO3 (CSZ) ceramics were investigated in this study. CSZ ceramics were prepared using solid-state reaction process, which were sintered in air at temperatures ranging from 1350 oC to 1450 oC. Their structures were characterized by X-ray Diffraction (XRD), Scanning Electron Microscopy (SEM), and Transmission Electron Microscopy (TEM). The change in Ca/Sr ratio significantly affected the crystalline phase and the dielectric properties of the (CaxSr(1-x))ZrO3 ceramics. The secondary phase, Ca0.15Zr0.85O1.85, was observed and increased correspondingly with the rising of sintering temperatures. In order to understand the effects of secondary phase on the dielectric properties of CSZ ceramics, the Ca0.15Zr0.85O1.85 phase was prepared individually using solidstate method. The Ca0.15Zr0.85O1.85 ceramics sintered at 1500 oC for 2 hours possessed a dielectric constant (εr) of 21.7, a dielectric loss (tanδ) of 49.510−4 and an Insulation Resistance (IR) of 2.1 × 1010 Ω. The (Ca0.7Sr0.3)ZrO3 ceramics exhibited the best dielectric properties, with a permittivity of 29, a dielectric loss (tanδ) of 2.7 × 10−4, and an Insulation Resistance (IR) of 2.6 × 1012 Ω.

Keywords: A. Ceramics, Inorganic Compounds, B. Chemical Synthesis, Microstructure, C. Transmission Electron Microscopy (TEM), X-ray Diffraction, D. Dielectric Properties, Crystal Structure.

This Article

  • 2018; 19(6): 461-466

    Published on Dec 31, 2018

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