Cu(InAl)Se2 (CIAS) thin films of different thicknesses were prepared by a chemical bath deposition technique(CBD) onto wellcleaned substrates and the thicknesses of the deposited films were determined by a gravimetric technique. The films are investigated with X-ray diffraction, scanning electron microscopy and optical spectroscopy. The structural characterization was carried out by X-ray diffraction which confirms the polycrystalline nature of the films with a tetragonal structure. SEM analysis of the films enabled the conclusion that the prepared films are uniform, smooth and polycrystalline. From the transmittance spectra the type of transition and band gaps of the films were estimated. From the results of the structural and optical analysis, CIAS has been identified as an alternate solar cell absorber.

Keywords: CIAS, XRD, SEM, CBD.