Ceramic samples of a complex structural formula Ba6-3xR8,2xTi18O54, where R is a rare-earth oxide and R=Sm, Nd and Gd and x=0.2-0.7 were prepared by a high temperature solid-state reaction technique. The dielectric properties (i.e. dielectric constant (epsilon'), dielectric loss (epsilon '') and Q-factor) have been measured on the sintered disks with respect to the frequency in the range 0.3 GRz-3.0 GHz at room temperature. The dielectric properties of the synthesized samples have been found out to be a function of the wt.% of rare-earth oxides used. Dielectric conductivity (sigma) was derived from the dielectric constant and loss tangent data in the same frequency range. Conductivity calculations were carried out based on this derived formula. The capacitance values have been calculated knowing the geometrical dimensions of the samples synthesized.

Keywords: tungsten-bronze structure; dielectric constant; dielectric loss; dielectric conductivity